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EPOCH 650 Flaw Detector: Reliable, handheld ultrasonic testing with 15H use, 2GB storage, vivid LCD, and rugged design for demanding environments.
The Panametrics-NDTTM EPOCH 4 is an advanced digital ultrasonic flaw detector that combines powerful, fully featured measurement capabilities, a comprehensive internal datalogger, and a wide range of software options to solve many demanding inspection problems.
The Wohler VIS 350 PLUS is a robust, professional-grade inspection camera system designed for sewer, drain, flue, and duct inspections. It features interchangeable 1.5″ pan & tilt and 1″ forward-viewing camera heads, a tiltable removable 7″ TFT monitor, integrated transmitter for locating, electronic distance counter, and video/photo recording—all housed in a rugged case for field use.
Certified pre-owned Panametrics ABWM-5T 70 70° shear wave angle beam wedge. Designed for 0.50" transducers using the Accupath series. Ideal for high-angle weld inspections in steel.
Certified pre-owned Olympus EPOCH 4 ultrasonic flaw detector with DAC & TVG.. Function-tested and ready for service. Live Chat or call 1-833-322-7865.
Olympus EPOCH 600 Ultrasonic Flaw Detector: Reliable, high-precision testing for industrial applications. Compact design, long battery life, and advanced AWS & API5UE options.
Olympus Innov-X DELTA Classic DC-2000 handheld XRF analyzer with Alloy mode for non-destructive elemental analysis, alloy identification, and field-based material verification using portable X-ray fluorescence technology.
Refurbished Thermo Scientific Niton XL3 980 GOLDD+ Handheld XRF Analyzer with Mining Cu/Zn, Mining Ta/Hf, and General Metals modes for fast alloy, ore, and geochemical analysis.
DAC, TVG, AWS 1.1, and AAUX205A installed on the Olympus Panametrics Epoch 4 ultrasonic flaw detector. Certified pre-owned, function-tested for reliable NDT flaw evaluation and code-compliant inspections.
Thermo Niton XL3t 985 Ultra SDD handheld XRF, licensed for General Metals. 45 mm² SDD and 50 kV GOLDD+ tube deliver fast alloy ID with high sensitivity to Mg, Al, and Si; He-purge ready for sub-0.05% Si detection.