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Category: Nondestructive Testing (NDT)

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GE Inspections Phased Array Probe High Performance Inspection Tool Accessories

GE Inspection Technologies General Phased Array Probe #115-500-014, 5MHz, 32EL

GE Inspections Phased Array Probe: Compact, high-performance probe for accurate weld, pipe, and turbine inspections. Reliable, durable, and versatile for diverse applications.

$3,499.95

Waygate Mentor Visual iQ VideoProbe MVIQCSYS2-WS W/ MVIQAP6130 6.1mm/3M Quick Change Probe

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Rohmann ELOTEST M2 LS V2 Portable Eddy Current Flaw Detector Product View

Rohmann ELOTEST M2 LS V2 Portable eddy current flaw detector for non-destructive testing (NDT)

Rohmann ELOTEST M2 LS V2 portable eddy current flaw detector with M2-LS Base Unit for Lift-Off Suppression. Firmware 2.10, dual-frequency operation, and M2-N14 analog architecture for reliable surface and subsurface inspection.

$5,999.95

Olympus Epoch 4: Advanced ultrasonic flaw detector for precise material inspections, featuring DAC, TVG, PRF, CSC, SPOTWELD, DGS, AWS D1.1, and API 5UE.

Olympus Epoch 4 Ultrasonic Flaw Detector W/ DAC, TVG, PRF, CSC, SPOTWELD, DGS, Floating Gate, AWS D1.1 and API 5UE

The Panametrics-NDTTM EPOCH 4 is an advanced digital ultrasonic flaw detector that combines powerful, fully featured measurement capabilities, a comprehensive internal datalogger, and a wide range of software options to solve many demanding inspection problems.

$2,199.95

SciAps Z-200C handheld LIBS analyzer with Element Pro option and onboard argon purge system for rapid alloy and elemental identification Includes Argon Ampules and Check Standards – Cartoli certified 18333227865

SciAps Z-200 Handheld LIBS Analyzer For Alloy and Element Pro

The SciAps Z-200 LIBS Analyzer with Element Pro Option is a handheld, laser-based spectrometer featuring advanced elemental and alloy analysis, onboard argon purge, and extensive calibration options. Designed for rapid, accurate, and field-ready metal testing in recycling, manufacturing, and quality assurance.

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GE Inspection Technologies General Phased Array Probe #115-500-014, 5MHz, 32EL

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Search results for: 'blade keys'

GE Inspection Technologies General Phased Array Probe #115-500-014, 5MHz, 32EL

Waygate Mentor Visual iQ VideoProbe MVIQCSYS2-WS W/ MVIQAP6130 6.1mm/3M Quick Change Probe

Rohmann ELOTEST M2 LS V2 Portable eddy current flaw detector for non-destructive testing (NDT)

Olympus Epoch 4 Ultrasonic Flaw Detector W/ DAC, TVG, PRF, CSC, SPOTWELD, DGS, Floating Gate, AWS D1.1 and API 5UE

SciAps Z-200 Handheld LIBS Analyzer For Alloy and Element Pro