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Olympus AM1R-20X22-70 is a 1 MHz, 20x22 mm angle beam shear wave ultrasonic probe (Atlas Series) with a 70° angle in steel and right angle LEMO 1 connector—ideal for deep-penetration weld inspection and flaw detection.
Certified pre-owned Sonatest FCG2525, 2.25 MHz 1/4" fingertip compression wave transducer with Microdot connector—medium damped for reliable flaw detection and thickness measurement in confined areas. Compatible with Sonatest Sitescan, Prisma, Veo+, and Masterscan flaw detectors.
Olympus AM1R-20X22-60 is a 2 MHz, 20x22 mm angle beam shear wave ultrasonic probe (Atlas Series) with a 60° angle in steel and right angle LEMO 1 connector—ideal for weld inspection and flaw detection.
Olympus AM2R-20X22-70 is a 2 MHz, 20x22 mm angle beam shear wave ultrasonic probe (Atlas Series) with a 70° angle in steel and right angle LEMO 1 connector—ideal for weld and flaw inspection in heavy industry.
Olympus HI-6780 dual-element ultrasonic immersion transducer for reliable NDT flaw detection, compatible with pitch-catch systems and 1 MHz immersion testing.
Olympus EPOCH 4 Ultrasonic Flaw Detector: Precision for Demanding Inspections
Used Sonatest FCG5025 2.25 MHz fingertip compression wave ultrasonic transducer with a 0.50" crystal diameter and side connector. Medium bandwidth for reliable flaw detection in castings, forgings, and thickness measurements. Fully tested and certified.
Olympus OmniScan X3 64:128 phased array and TFM flaw detector with 64 pulsers, 128 receivers, full 64 element aperture, up to four TFM groups, live TFM envelope, AIM visualization, IP65 enclosure, and 10.6 in touchscreen.
XL-PMI is fluorescence (XRF) analyzers based on Thermo Fisher Scientific technology. XL-PMI is the tool of choice when you need precision, precision and ease of use. It is an ideal tool for analyzing metal alloys for industrial applications or product quality control. It provides immediate non-destructive chemical analysis of materials from alloys from titanium to nickel, and also provides excellent performance for the analysis of foreign inclusions and trace elements.Â